Browsing by author "Hangen, Ude"
Now showing items 1-7 of 7
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Assessment of mechanical properties in nanotechnology: porous low-k dielectrics, TSVs and bumps
Vanstreels, Kris; De Wolf, Ingrid; Hangen, Ude (2013) -
Determination of thermal expansion coefficients of low-k dielectrics by cube corner indentation tests at elevated temperatures
Vanstreels, Kris; Zahedmanesh, Houman; Verdonck, Patrick; Hangen, Ude; Baklanov, Mikhaïl (2016) -
Extraction of elastic modulus of porous ultra-thin low-k films by two-dimensional finite-element simulations of nanoindentation
Okudur, Oguzhan Orkut; Vanstreels, Kris; De Wolf, Ingrid; Hangen, Ude (2016) -
Mechanical behavior of porous thin low-k films during nanoindentation
Okudur, Oguzhan Orkut; Vanstreels, Kris; Saleh, Ahmed Sobhi; Hangen, Ude; De Wolf, Ingrid (2019) -
Substrate independent elastic modulus of thin low dielectric constant materials
Okudur, Oguzhan Orkut; Vanstreels, Kris; De Wolf, Ingrid; Hangen, Ude; Qiu, Anqi (2017) -
Substrate independent mechanical properties of thin low dielectric constant materials
Okudur, Oguzhan Orkut; Vanstreels, Kris; Hangen, Ude; Qui, Anqi; De Wolf, Ingrid (2016) -
Thermal expansion coefficients of ultralow-k dielectric films by cube corner indentation tests at elevated temperatures
Vanstreels, Kris; Zahedmanesh, Houman; Hangen, Ude (2015)