Browsing by author "Griffin, P. B."
Now showing items 1-2 of 2
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Influence of process-induced stress on device characteristics and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1999) -
The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1996)