Browsing by author "Tuomisto, F."
Now showing items 1-2 of 2
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Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/GeSi1-x/SiO2/(100)Si structures with nm-thin GexSi1-x layers
Madia, O.; Nguyen, A.P.D.; Thoan, N.H.; Afanasiev, Valeri; Stesmans, Andre; Souriau, Laurent; Slotte, J.; Tuomisto, F. (2014) -
Vacancy clusters in germanium
Peaker, A.R.; Markevich, V.P.; Slotte, J.; Kuitunen, K.; Tuomisto, F.; Satta, Alessandra; Simoen, Eddy; Capan, I.; Pivac, B.; Jacimovic, R. (2008)