Browsing by author "Ayala, N."
Now showing items 1-4 of 4
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Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Martin-Martinez, J.; Amat, E.; Ayala, N.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2011) -
Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs
Ayala, N.; Martin-Martinez, J.; Rodriguez, R.; Gonzalez, M.B.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2012) -
Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Martin-Martinez, Javier; Kaczer, Ben; Boix, J.; Ayala, N.; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X.; Zuber, Paul; Dierickx, Bart; Groeseneken, Guido (2009-02) -
NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance
Ayala, N.; Martin-Martinez, J.; Amat, E.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Simoen, Eddy (2011)