Publication:

Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits

Date

2011

Proceedings Paper

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Files

23039.pdf 160.06 KB

Author(s)

Martin-Martinez, J.

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Bargallo Gonzalez, Mireia

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Verheyen, Peter

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Statistics

1907 since deposited on 2021-10-19

2last month

Acq. date: 2026-04-27