Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Publication:
Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23039.pdf
160.06 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin-Martinez, J.
;
Amat, E.
;
Ayala, N.
;
Bargallo Gonzalez, Mireia
;
Verheyen, Peter
;
Rodriguez, R.
;
Nafria, M.
;
Aymerich, X.
;
Simoen, Eddy
Journal
Abstract
Description
Metrics
Views
1897
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1897
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations