Browsing by author "Heinrich, P."
Now showing items 1-2 of 2
-
Vacuum UV spectroscopic ellipsometry applied to the characterization of high-k dielectrics
Boher, P.; Defranoux, C.; Heinrich, P.; Wolstenholme, J.; Bender, Hugo (2003) -
VUV spectroscopic ellipsometry applied to the characterization of high-k dielectrics
Boher, P.; Defranoux, C.; Heinrich, P.; Wolstenholme, J.; Bender, Hugo (2004)