Browsing by author "Saini, Nishant"
Now showing items 1-2 of 2
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Experimental Study Of Interface & Bulk Defectivity In Ultra-Thin BEOL Dielectrics By Using Low Frequency Noise Spectroscopy
Saini, Nishant; Tierno, Davide; Croes, Kristof; Afanasiev, Valeri (2023) -
Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy
Saini, Nishant; Tierno, Davide; Croes, Kristof; Afanasiev, Valeri; Van Houdt, Jan (2024)