Browsing by author "Raynaud, C."

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Influence of device engineering on the analog and RF performances of SOI MOSFETs

Kilchytska, V.; Nève, A.; Vancaillie, L.; Levacq, D.; Adriaensen, S.; van Meer, Hans; Raynaud, C.; Dehan, M.; Raskin, J.P.; Flandre, D. (2003)
Shrinking from 0.25 μm down to 0.12 μm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs

Dieudonné, F.; Haendler, S.; Jomaah, J.; Raynaud, C.; De Meyer, Kristin; van Meer, Hans; Balestra, F. (2002)