Browsing imec Publications by imec author "012add7979ca17c7cdeea79ea91808a28cd7f5ee"
Now showing items 1-2 of 2
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Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021) -
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET's
Jung, Taehwan; O'Sullivan, Barry J.; Ronchi, Nicolo; Linten, Dimitri; Shin, Changhwan; Van Houdt, Jan (2021)