Browsing imec Publications by author "Abou-Khalil, M."
Now showing items 1-2 of 2
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Calculation of the HF characteristics in high electron mobility transistors by considering capture and escape phenomena in the Monte Carlo technique
Abou-Khalil, M.; Schreurs, Dominique; Matsui, T.; Wu, K. (1997) -
Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors
Abou-Khalil, M.; Schreurs, Dominique; Nauwelaers, Bart; Van Rossum, Marc; Maciejko, R.; Wuyts, Koen (1997)