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Study of a-Si:H tail state distributions through analytical multiple-trapping modeling

dc.contributor.authorArkhipov, Vladimir
dc.contributor.authorEmelianova, Evguenia
dc.contributor.authorBrinza, Monica
dc.contributor.authorAdriaenssens, Guy
dc.date.accessioned2021-10-16T00:42:59Z
dc.date.available2021-10-16T00:42:59Z
dc.date.issued2005-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10028
dc.sourceIIOimport
dc.titleStudy of a-Si:H tail state distributions through analytical multiple-trapping modeling
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage951
dc.source.endpage954
dc.source.journalJournal of Optoelectronics and Advanced Materials
dc.source.issue2
dc.source.volume7
imec.availabilityPublished - imec


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