dc.contributor.author | Breuil, Laurent | |
dc.contributor.author | Haspeslagh, Luc | |
dc.contributor.author | Lorenzini, Martino | |
dc.contributor.author | De Vos, Joeri | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-16T00:50:24Z | |
dc.date.available | 2021-10-16T00:50:24Z | |
dc.date.issued | 2005-11 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10153 | |
dc.source | IIOimport | |
dc.title | Scaling effects in dual-bit split-gate memory devices | |
dc.type | Journal article | |
dc.contributor.imecauthor | Breuil, Laurent | |
dc.contributor.imecauthor | Haspeslagh, Luc | |
dc.contributor.imecauthor | De Vos, Joeri | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
dc.contributor.orcidimec | De Vos, Joeri::0000-0002-9332-9336 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1862 | |
dc.source.endpage | 1866 | |
dc.source.journal | Solid-State Electronics | |
dc.source.issue | 11 | |
dc.source.volume | 49 | |
imec.availability | Published - imec | |