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Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms

dc.contributor.authorWellekens, Dirk
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorFaraone, Lorenzo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T13:25:52Z
dc.date.available2021-09-29T13:25:52Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1015
dc.sourceIIOimport
dc.titleWrite/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms
dc.typeJournal article
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage1992
dc.source.endpage1998
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue11
dc.source.volume42
imec.availabilityPublished - imec


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