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Radiation and Reliability Aspects of Electrically Erasable Floating Gate Memory Devices

dc.contributor.authorWellekens, Dirk
dc.date.accessioned2021-09-29T13:26:01Z
dc.date.available2021-09-29T13:26:01Z
dc.date.issued1995-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1017
dc.sourceIIOimport
dc.titleRadiation and Reliability Aspects of Electrically Erasable Floating Gate Memory Devices
dc.typePHD thesis
dc.contributor.imecauthorWellekens, Dirk
dc.source.peerreviewno
imec.availabilityPublished - imec
imec.internalnotesThesis Advisor : Prof. Dr. Ir. H. Maes


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