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Short minority carrier response time in HfO2/Ge metal-insulator-semiconductor capacitors

dc.contributor.authordimoulas, A.
dc.contributor.authorVellianitis, G.
dc.contributor.authorMavrou, G.
dc.contributor.authorEvengelou, E.
dc.contributor.authorArgyropoulos, K.
dc.contributor.authorHoussa, Michel
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-10-16T01:22:55Z
dc.date.available2021-10-16T01:22:55Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10391
dc.sourceIIOimport
dc.titleShort minority carrier response time in HfO2/Ge metal-insulator-semiconductor capacitors
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage34
dc.source.endpage37
dc.source.journalMicroelectronic Engineering
dc.source.volume80
imec.availabilityPublished - imec
imec.internalnotesPaper from the 14th INFOS conference; June 2005


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