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Scaling down the interpoly dielectric for next generation flash memory: challenges and opportunities

dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorBrunco, David
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-16T01:49:19Z
dc.date.available2021-10-16T01:49:19Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10523
dc.sourceIIOimport
dc.titleScaling down the interpoly dielectric for next generation flash memory: challenges and opportunities
dc.typeJournal article
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage1841
dc.source.endpage1848
dc.source.journalSolid-State Electronics
dc.source.issue11
dc.source.volume49
imec.availabilityPublished - imec


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