Show simple item record

Modelling negative bias temperature instabilities in advanced pMOSFETs

dc.contributor.authorHoussa, Michel
dc.date.accessioned2021-10-16T02:09:55Z
dc.date.available2021-10-16T02:09:55Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10610
dc.sourceIIOimport
dc.titleModelling negative bias temperature instabilities in advanced pMOSFETs
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage3
dc.source.endpage12
dc.source.journalMicroelectronic Reliability
dc.source.issue1
dc.source.volume45
imec.availabilityPublished - imec
imec.internalnotes


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record