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Performance and reliability aspects of FOND: A new deep submicron CMOS device concept

dc.contributor.authorBellens, Rudi
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorHabas, Predrag
dc.contributor.authorMieville, Jean-Paul
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorClerix, Andre
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDeferm, Ludo
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T14:16:36Z
dc.date.available2021-09-29T14:16:36Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1075
dc.sourceIIOimport
dc.titlePerformance and reliability aspects of FOND: A new deep submicron CMOS device concept
dc.typeJournal article
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorClerix, Andre
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1407
dc.source.endpage1415
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue9
dc.source.volume43
imec.availabilityPublished - open access


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