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Formation of misfit dislocations at the thin strained Si/strain relaxed buffer interface

dc.contributor.authorLoo, Roger
dc.contributor.authorDelhougne, Romain
dc.contributor.authorCaymax, Matty
dc.contributor.authorRies, Mike
dc.date.accessioned2021-10-16T03:01:30Z
dc.date.available2021-10-16T03:01:30Z
dc.date.issued2005-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10801
dc.sourceIIOimport
dc.titleFormation of misfit dislocations at the thin strained Si/strain relaxed buffer interface
dc.typeJournal article
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.beginpage182108-1
dc.source.endpage182108-3
dc.source.journalApplied Physics Letters
dc.source.issue18
dc.source.volume87
imec.availabilityPublished - imec


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