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Low-cost BER tester measures errors in low-data-rate applications

dc.contributor.authorMelange, Cedric
dc.contributor.authorBauwelinck, Johan
dc.contributor.authorPletinckx, J.
dc.contributor.authorVandewege, Jan
dc.date.accessioned2021-10-16T03:24:05Z
dc.date.available2021-10-16T03:24:05Z
dc.date.issued2005-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10879
dc.sourceIIOimport
dc.titleLow-cost BER tester measures errors in low-data-rate applications
dc.typeJournal article
dc.contributor.imecauthorBauwelinck, Johan
dc.contributor.orcidimecBauwelinck, Johan::0000-0001-5254-2408
dc.source.peerreviewno
dc.source.beginpage123
dc.source.endpage124
dc.source.journalEDN
dc.source.issue25
dc.source.volume50
imec.availabilityPublished - imec
imec.internalnotes


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