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Degradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors

dc.contributor.authorMenou, N.
dc.contributor.authorCastagnos, A.M.
dc.contributor.authorMuller, Ch.
dc.contributor.authorGoguenheim, D.
dc.contributor.authorGoux, Ludovic
dc.contributor.authorWouters, Dirk
dc.contributor.authorHodeau, J.L.
dc.contributor.authorDooryhee, E.
dc.contributor.authorBarett, R.
dc.date.accessioned2021-10-16T03:24:42Z
dc.date.available2021-10-16T03:24:42Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10881
dc.sourceIIOimport
dc.titleDegradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewno
dc.source.beginpage044106-1
dc.source.endpage044106-8
dc.source.journalJournal of Applied Physics
dc.source.issue4
dc.source.volume97
imec.availabilityPublished - imec


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