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New current-defined threshold voltage model from 2D potential distribution calculations in MOSFETs

dc.contributor.authorBiesemans, Serge
dc.contributor.authorKubicek, Stefan
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-09-29T14:17:23Z
dc.date.available2021-09-29T14:17:23Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1092
dc.sourceIIOimport
dc.titleNew current-defined threshold voltage model from 2D potential distribution calculations in MOSFETs
dc.typeJournal article
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage43
dc.source.endpage48
dc.source.journalSolid-State Electronics
dc.source.volume39
imec.availabilityPublished - open access


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