Radiaton damage of SiC Schotttky diodes by electron irradiation
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Watanabe, T. | |
dc.contributor.author | Nishiyama, K. | |
dc.contributor.author | Shigaki, K. | |
dc.contributor.author | Kudou, T. | |
dc.contributor.author | Nakabayashi, M. | |
dc.contributor.author | Kuboyama, S. | |
dc.contributor.author | Matsuda, S. | |
dc.contributor.author | Kamezawa, C. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-16T03:45:04Z | |
dc.date.available | 2021-10-16T03:45:04Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10951 | |
dc.source | IIOimport | |
dc.title | Radiaton damage of SiC Schotttky diodes by electron irradiation | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 455 | |
dc.source.endpage | 458 | |
dc.source.journal | Journal of Materials Science: Materials in Electronics | |
dc.source.issue | 7 | |
dc.source.volume | 6 | |
imec.availability | Published - open access |