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First-principle calculations on gate/dielectric interfaces: on the origin of the work function shifts

dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorLauwers, Anne
dc.contributor.authorKittl, Jorge
dc.contributor.authorPantisano, Luigi
dc.contributor.authorSoree, Bart
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorMagnus, Wim
dc.contributor.authorHeyns, Marc
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-16T04:14:00Z
dc.date.available2021-10-16T04:14:00Z
dc.date.issued2005-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11049
dc.sourceIIOimport
dc.titleFirst-principle calculations on gate/dielectric interfaces: on the origin of the work function shifts
dc.typeJournal article
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMaex, Karen
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage272
dc.source.endpage279
dc.source.journalMicroelectronic Engineering
dc.source.volume80
imec.availabilityPublished - open access
imec.internalnotesPaper from the 14th biennial Conference on Insulating Films on Semiconductors, Leuven, June 2005


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