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Characterisation of reliability of compound semiconductor devices using electrical pulses

dc.contributor.authorBrandt, M.
dc.contributor.authorKrozer, V.
dc.contributor.authorSchuessler, M.
dc.contributor.authorBock, Karlheinz
dc.contributor.authorHartnagel, H. L.
dc.date.accessioned2021-09-29T14:18:01Z
dc.date.available2021-09-29T14:18:01Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1104
dc.sourceIIOimport
dc.titleCharacterisation of reliability of compound semiconductor devices using electrical pulses
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1891
dc.source.endpage1894
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
imec.availabilityPublished - imec


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