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High-temperature performance of state-of-the-art triple-gate transistors

dc.contributor.authorAkarvardar, K.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorSubramanian, Vaidy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGentil, P.
dc.contributor.authorCristoloveanu, S.
dc.date.accessioned2021-10-16T15:00:17Z
dc.date.available2021-10-16T15:00:17Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11633
dc.sourceIIOimport
dc.titleHigh-temperature performance of state-of-the-art triple-gate transistors
dc.typeJournal article
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2065
dc.source.endpage2069
dc.source.journalMicroelectronics Reliability
dc.source.issue12
dc.source.volume47
imec.availabilityPublished - open access


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