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Materials and electrical characterization of molecular beam deposited CeO2

dc.contributor.authorBrunco, David
dc.contributor.authordimoulas, A.
dc.contributor.authorBoukos, N.
dc.contributor.authorHoussa, Michel
dc.contributor.authorConard, Thierry
dc.contributor.authorMartens, Koen
dc.contributor.authorZhao, Chao
dc.contributor.authorBellenger, Florence
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-16T15:12:08Z
dc.date.available2021-10-16T15:12:08Z
dc.date.issued2007-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11815
dc.sourceIIOimport
dc.titleMaterials and electrical characterization of molecular beam deposited CeO2
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewno
dc.source.beginpage24104
dc.source.journalJournal of Applied Physics
dc.source.issue2
dc.source.volume102
imec.availabilityPublished - imec


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