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Measuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors

dc.contributor.authorDebie, Peter
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-09-29T14:24:52Z
dc.date.available2021-09-29T14:24:52Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1184
dc.sourceIIOimport
dc.titleMeasuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors
dc.typeJournal article
dc.contributor.imecauthorMartens, Luc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage504
dc.source.endpage510
dc.source.journalIEEE Trans. Instrumentation and Measurement
dc.source.issue2
dc.source.volume45
imec.availabilityPublished - open access
imec.internalnotesSpecial issue on selected papers IMTC/95


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