dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Ogier, Jean-Luc | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-29T14:25:34Z | |
dc.date.available | 2021-09-29T14:25:34Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1190 | |
dc.source | IIOimport | |
dc.title | A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1651 | |
dc.source.endpage | 1654 | |
dc.source.journal | Microelectronics and Reliability | |
dc.source.volume | 36 | |
imec.availability | Published - open access | |
imec.internalnotes | Paper from ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. October 8-11, 1996. Enschede, The Netherlands. | |