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Determination and validation of new nonlinear FinFET model based on lookup ables

dc.contributor.authorCrupi, Giovanni
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorXiao, Dongping
dc.contributor.authorCaddemi, Alina
dc.contributor.authorParvais, Bertrand
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T15:27:01Z
dc.date.available2021-10-16T15:27:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11929
dc.sourceIIOimport
dc.titleDetermination and validation of new nonlinear FinFET model based on lookup ables
dc.typeJournal article
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage361
dc.source.endpage363
dc.source.journalIEEE Microwave and Wireless Components Letters
dc.source.issue5
dc.source.volume17
imec.availabilityPublished - imec


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