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Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior

dc.contributor.authorde Souza, M.
dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-16T15:36:02Z
dc.date.available2021-10-16T15:36:02Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11986
dc.sourceIIOimport
dc.titleLow temperature influence on the uniaxially strained FD SOI nMOSFETs behavior
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2121
dc.source.endpage2124
dc.source.journalMicroelectronic Engineering
dc.source.issue9_10
dc.source.volume84
imec.availabilityPublished - open access
imec.internalnotesPaper from INFOS 2007


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