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Correlation between bias stress instability and phototransistor operation of pentacene thin-film transistors

dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorVerlaak, Stijn
dc.contributor.authorSteudel, Soeren
dc.contributor.authorMyny, Kris
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-16T15:41:40Z
dc.date.available2021-10-16T15:41:40Z
dc.date.issued2007-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12021
dc.sourceIIOimport
dc.titleCorrelation between bias stress instability and phototransistor operation of pentacene thin-film transistors
dc.typeJournal article
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorMyny, Kris
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecMyny, Kris::0000-0002-5230-495X
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpage103508
dc.source.journalApplied Physics Letters
dc.source.issue91
dc.source.volume2007
imec.availabilityPublished - imec


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