Show simple item record

Ultra-thin gate oxide breakdown

dc.contributor.authorDepas, Michel
dc.contributor.authorHeyns, Marc
dc.contributor.authorMertens, Paul
dc.date.accessioned2021-09-29T14:26:53Z
dc.date.available2021-09-29T14:26:53Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1202
dc.sourceIIOimport
dc.titleUltra-thin gate oxide breakdown
dc.typeJournal article
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMertens, Paul
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage45
dc.source.endpage46
dc.source.journalEuropean Semiconductor
dc.source.issue3
dc.source.volume19
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
1178.pdf
Size:
514.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record