dc.contributor.author | Ercken, Monique | |
dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Leray, Philippe | |
dc.date.accessioned | 2021-10-16T16:01:48Z | |
dc.date.available | 2021-10-16T16:01:48Z | |
dc.date.issued | 2007-05 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12128 | |
dc.source | IIOimport | |
dc.title | Immersion photoresist qualification | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ercken, Monique | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.imecauthor | Leray, Philippe | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.source.peerreview | no | |
dc.source.beginpage | 2 | |
dc.source.journal | Semiconductor Fabtech | |
dc.source.issue | 34 | |
imec.availability | Published - imec | |