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New operating mode based on electron/hole profile matching in nitride-based nonvolatile memories

dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-16T16:12:19Z
dc.date.available2021-10-16T16:12:19Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12177
dc.sourceIIOimport
dc.titleNew operating mode based on electron/hole profile matching in nitride-based nonvolatile memories
dc.typeJournal article
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage276
dc.source.endpage278
dc.source.journalIEEE Electron Device Letters
dc.source.issue4
dc.source.volume28
imec.availabilityPublished - imec


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