A simple technique for the separation of bulk  and surface recombination parameters in silicon

dc.contributor.author	Gaubas, Eugenijus
dc.contributor.author	Vanhellemont, Jan
dc.date.accessioned	2021-09-29T14:29:46Z
dc.date.available	2021-09-29T14:29:46Z
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1227
dc.source	IIOimport
dc.title	A simple technique for the separation of bulk and surface recombination parameters in silicon
dc.type	Journal article
dc.date.embargo	9999-12-31
dc.source.peerreview	no
dc.source.beginpage	6293
dc.source.endpage	6297
dc.source.journal	Journal of Applied Physics
dc.source.issue	11
dc.source.volume	80
imec.availability	Published - open access