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Millimeter wave inspection of concealed objects

dc.contributor.authorJaeger, I.
dc.contributor.authorZhang, L.
dc.contributor.authorStiens, J.
dc.contributor.authorSahli, Hichem
dc.contributor.authorVounckx, Roger
dc.date.accessioned2021-10-16T16:52:49Z
dc.date.available2021-10-16T16:52:49Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12346
dc.sourceIIOimport
dc.titleMillimeter wave inspection of concealed objects
dc.typeJournal article
dc.contributor.imecauthorSahli, Hichem
dc.contributor.imecauthorVounckx, Roger
dc.source.peerreviewno
dc.source.beginpage2733
dc.source.endpage2737
dc.source.journalMicrowave and Optical Technology Letters
dc.source.issue11
dc.source.volume49
imec.availabilityPublished - imec


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