Influence of oxygen desorption on in-situ analysis of the surface composition during O2+ bombardment of Si
dc.contributor.author | Janssens, Tom | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-16T16:55:54Z | |
dc.date.available | 2021-10-16T16:55:54Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12358 | |
dc.source | IIOimport | |
dc.title | Influence of oxygen desorption on in-situ analysis of the surface composition during O2+ bombardment of Si | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.source.peerreview | no | |
dc.source.beginpage | 763 | |
dc.source.endpage | 771 | |
dc.source.journal | Surface Science | |
dc.source.issue | 3 | |
dc.source.volume | 601 | |
imec.availability | Published - imec |
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