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Observation of single interface traps in submicron MOSFET's by charge pumping

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorBellens, Rudi
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T14:31:24Z
dc.date.available2021-09-29T14:31:24Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1240
dc.sourceIIOimport
dc.titleObservation of single interface traps in submicron MOSFET's by charge pumping
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Wolf, Ingrid
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage940
dc.source.endpage945
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue6
dc.source.volume43
imec.availabilityPublished - open access


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