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Experimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)

dc.contributor.authorMasahara, Meishoku
dc.contributor.authorSurdeanu, Radu
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorDoornbos, Gerben
dc.contributor.authorNguyen Hoang, Viet
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVrancken, Christa
dc.contributor.authorJurczak, Gosia
dc.contributor.authorBiesemans, Serge
dc.date.accessioned2021-10-16T17:53:46Z
dc.date.available2021-10-16T17:53:46Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12565
dc.sourceIIOimport
dc.titleExperimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)
dc.typeJournal article
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorDoornbos, Gerben
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVrancken, Christa
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1431
dc.source.endpage1437
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue6
dc.source.volume54
imec.availabilityPublished - open access


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