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Analysis of the FinFET parasitics for improved RF performances

dc.contributor.authorParvais, Bertrand
dc.contributor.authorDehan, Morin
dc.contributor.authorSubramanian, Vaidy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorTamer San, Kemal
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorSansen, Willy
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T18:28:39Z
dc.date.available2021-10-16T18:28:39Z
dc.date.issued2007-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12675
dc.sourceIIOimport
dc.titleAnalysis of the FinFET parasitics for improved RF performances
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage37
dc.source.endpage38
dc.source.conferenceIEEE International SOI Conference
dc.source.conferencedate1/10/2007
dc.source.conferencelocationIndian Wells, CA USA
imec.availabilityPublished - imec


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