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Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs

dc.contributor.authorPavanello, Marcelo Antonio
dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-16T18:30:40Z
dc.date.available2021-10-16T18:30:40Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12681
dc.sourceIIOimport
dc.titleAnalysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1194
dc.source.endpage1200
dc.source.journalSolid-State Electronics
dc.source.issue9
dc.source.volume51
imec.availabilityPublished - imec
imec.internalnotesPapers selected from the EUROSOI '07 conference


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