dc.contributor.author | Puzzilli, G. | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Irrera, F. | |
dc.contributor.author | Rosmeulen, Maarten | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-16T18:50:39Z | |
dc.date.available | 2021-10-16T18:50:39Z | |
dc.date.issued | 2007-06 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12744 | |
dc.source | IIOimport | |
dc.title | Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed CV-technique | |
dc.type | Journal article | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Rosmeulen, Maarten | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 508 | |
dc.source.endpage | 512 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 4_5 | |
dc.source.volume | 47 | |
imec.availability | Published - open access | |
imec.internalnotes | Paper from WoDiM 2006 | |