Show simple item record

Using multisines to measure state-of-the-art analog to digital converters

dc.contributor.authorRabijns, D.
dc.contributor.authorVan Moer, W.
dc.contributor.authorVandersteen, Gerd
dc.date.accessioned2021-10-16T18:50:57Z
dc.date.available2021-10-16T18:50:57Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12745
dc.sourceIIOimport
dc.titleUsing multisines to measure state-of-the-art analog to digital converters
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1012
dc.source.endpage1017
dc.source.journalIEEE Trans. Instrumentation and Measurement
dc.source.issue3
dc.source.volume56
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
15596.pdf
Size:
921.3Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record