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dc.contributor.authorRoussel, Philippe
dc.contributor.authorDegraeve, Robin
dc.contributor.authorSahhaf, Sahar
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T19:14:34Z
dc.date.available2021-10-16T19:14:34Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12815
dc.sourceIIOimport
dc.titleA consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling
dc.typeJournal article
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorSahhaf, Sahar
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.beginpage1925
dc.source.endpage1925
dc.source.journalMicroelectronic Engineering
dc.source.issue9_10
dc.source.volume84
imec.availabilityPublished - imec
imec.internalnotesPaper from INFOS 2007


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