dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Sahhaf, Sahar | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-16T19:14:34Z | |
dc.date.available | 2021-10-16T19:14:34Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12815 | |
dc.source | IIOimport | |
dc.title | A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling | |
dc.type | Journal article | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Sahhaf, Sahar | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1925 | |
dc.source.endpage | 1925 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 9_10 | |
dc.source.volume | 84 | |
imec.availability | Published - imec | |
imec.internalnotes | Paper from INFOS 2007 | |