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Localized strain characterization using electron diffraction contrast imaging

dc.contributor.authorJanssens, Koenraad
dc.date.accessioned2021-09-29T14:36:49Z
dc.date.available2021-09-29T14:36:49Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1282
dc.sourceIIOimport
dc.titleLocalized strain characterization using electron diffraction contrast imaging
dc.typePHD thesis
dc.source.peerreviewno
imec.availabilityPublished - imec
imec.internalnotesThesis advisors : Prof. Dr. O. Van der Biest and Prof. Dr. H. E. Maes


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