Defects localization and nature in bulk and thin film utrananocrystalline diamond
dc.contributor.author | Shames, A.I. | |
dc.contributor.author | Panich, A.M. | |
dc.contributor.author | Porro, S. | |
dc.contributor.author | Rovere, M. | |
dc.contributor.author | Musso, S. | |
dc.contributor.author | Tagliaferro, A. | |
dc.contributor.author | Baidakova, M.V. | |
dc.contributor.author | Osipov, V.Y. | |
dc.contributor.author | Vul, A.Y. | |
dc.contributor.author | Enoki, T. | |
dc.contributor.author | Takahashi, M. | |
dc.contributor.author | Osawa, E. | |
dc.contributor.author | Williams, Oliver | |
dc.contributor.author | Bruno, P. | |
dc.contributor.author | Gruen, D.M. | |
dc.date.accessioned | 2021-10-16T19:37:15Z | |
dc.date.available | 2021-10-16T19:37:15Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12881 | |
dc.source | IIOimport | |
dc.title | Defects localization and nature in bulk and thin film utrananocrystalline diamond | |
dc.type | Journal article | |
dc.source.peerreview | no | |
dc.source.beginpage | 1806 | |
dc.source.endpage | 1812 | |
dc.source.journal | Diamond and Related Materials | |
dc.source.issue | 10 | |
dc.source.volume | 16 | |
imec.availability | Published - imec |
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