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dc.contributor.authorShames, A.I.
dc.contributor.authorPanich, A.M.
dc.contributor.authorPorro, S.
dc.contributor.authorRovere, M.
dc.contributor.authorMusso, S.
dc.contributor.authorTagliaferro, A.
dc.contributor.authorBaidakova, M.V.
dc.contributor.authorOsipov, V.Y.
dc.contributor.authorVul, A.Y.
dc.contributor.authorEnoki, T.
dc.contributor.authorTakahashi, M.
dc.contributor.authorOsawa, E.
dc.contributor.authorWilliams, Oliver
dc.contributor.authorBruno, P.
dc.contributor.authorGruen, D.M.
dc.date.accessioned2021-10-16T19:37:15Z
dc.date.available2021-10-16T19:37:15Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12881
dc.sourceIIOimport
dc.titleDefects localization and nature in bulk and thin film utrananocrystalline diamond
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1806
dc.source.endpage1812
dc.source.journalDiamond and Related Materials
dc.source.issue10
dc.source.volume16
imec.availabilityPublished - imec


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