dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Van Steenbergen, Jan | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Forment, S. | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Clauws, P. | |
dc.contributor.author | Theuwis, A. | |
dc.date.accessioned | 2021-10-16T19:45:51Z | |
dc.date.available | 2021-10-16T19:45:51Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12905 | |
dc.source | IIOimport | |
dc.title | Lifetime and leakage current considerations in metal-doped germanium | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Van Steenbergen, Jan | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 799 | |
dc.source.endpage | 804 | |
dc.source.journal | Journal of Materials Science: Materials in Electronics | |
dc.source.issue | 7 | |
dc.source.volume | 18 | |
imec.availability | Published - open access | |