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Defect analysis in semiconductor materials based on p-n junction diode characteristics

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorVanhellemont, Jan
dc.date.accessioned2021-10-16T19:46:10Z
dc.date.available2021-10-16T19:46:10Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12906
dc.sourceIIOimport
dc.titleDefect analysis in semiconductor materials based on p-n junction diode characteristics
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1
dc.source.endpage24
dc.source.journalDefect and Diffusion Forum
dc.source.volume261-262
imec.availabilityPublished - open access


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